1. Neural network based approach to the evaluation of degradation lifetime
- Creator:
- Okhonin, S., Okhonin, V., Ils, A., and Ilegems, M.
- Format:
- bez média and svazek
- Type:
- model:article and TEXT
- Subject:
- lifetime prediction, modeling, and neural networks
- Language:
- English
- Description:
- The applicability of neural networks for the evaluation of the lifetime of semiconductor devices is demonstrated. The neural network based method can be used as a general tool for modeling. The commonly used main-acceleratingparameter models could be obtained by the neural net reducing. The neural network based method is attractive also due to the neural net ability to process "noisy" data. The method should find wide applications in degradation modeling.
- Rights:
- http://creativecommons.org/publicdomain/mark/1.0/ and policy:public