Neural network based approach to the evaluation of degradation lifetime

Title:

Neural network based approach to the evaluation of degradation lifetime

Creator:

Okhonin, S., Okhonin, V., Ils, A., and Ilegems, M.

Identifier:

https://cdk.lib.cas.cz/client/handle/uuid:da5ee7a4-c1c8-4801-a7ae-48740969f857
uuid:da5ee7a4-c1c8-4801-a7ae-48740969f857

Subject:

lifetime prediction, modeling, and neural networks

Type:

model:article and TEXT

Format:

bez média and svazek

Description:

The applicability of neural networks for the evaluation of the lifetime of semiconductor devices is demonstrated. The neural network based method can be used as a general tool for modeling. The commonly used main-acceleratingparameter models could be obtained by the neural net reducing. The neural network based method is attractive also due to the neural net ability to process "noisy" data. The method should find wide applications in degradation modeling.

Language:

English

Rights:

http://creativecommons.org/publicdomain/mark/1.0/
policy:public

Source:

Neural network world: international journal on neural and mass-parallel computing and information systems | 2001 Volume:11 | Number:2

Harvested from:

CDK

Metadata only:

false