Nedávno byly publikovány první výsledky dosažené pomoci metody využívající pro účely zobrazovací hmotové spektrometrie ablaci zkoumaného materiálu submikronovým svazkem extrémního ultrafialového (XUV) laseru s kapilárním výbojem., Recently, significant advantages have been demonstrated using a compact capillary discharge extreme ultraviolet (XUV) with a wavelength of 46.9 nm for mass spectrometry applications. 26.4 eV energy photons provide efficient single photon ionisation while preserving the structure of molecules and clusters. A radiation absorption depth of tens of nanometres coupled with focusing of the laser beam to -100 nm results in the ablation of atto-litre scale craters, which in turn enables high resolution mass spectral imaging of solid samples. First results obtained with this new mass spectrometry imaging method, developed and implemented at he NSF Engineering Research Center for Extreme Ultraviolet Science and Technology in Fort Collins (CO, USA), are summarised in this brief review., Tomáš Burian, Ilya Kuznetsov, Libor Juha, Jorge J. Rocca, Carmen S. Menoni., and Obsahuje seznam literatury